Another way is that my great grandchildren won't care about inheriting my collection of hobbyist SBCs, and therefore nor should I.
Subsequently, in 1967, Black of Motorola experimentally derived a median time to failure (MTTF, i.e., operational lifetime) model for EM in Al interconnects, showing that the time to failure due to EM is inversely proportional to both the current density and the absolute temperature of the interconnect.
[1]: https://infinitalab.com/blog/ic-failure-analysis-defect-type...
[2]: https://resources.system-analysis.cadence.com/blog/msa2020-b...
[3]: https://www.mdpi.com/2079-9292/14/15/3151#sec3-electronics-1...